Desktop Field Emission Scanning Electron Microscope DSEM-100

Yidon Technologies DSEM-100 desktop field emission scanning electron microscope employs shottkey FEG combined with compound objective lens, delivering exceptional low-voltage imaging performance with a resolution of 1.5 nm @ 5 kV and 3 nm @ 1 kV. The instrument is well-suited for high-resolution imaging of a wide range of materials, with particular applicability to challenging specimens such as non-conductive samples and those susceptible to electron-beam irradiation damage.

DSEM-100 is equipped with In-lens Secondary Electron detector and Backscattered Electron detector, enabling efficient collection of multiple electron signals generated from the specimen. This configuration allows for the acquisition of microstructural, topological, and compositional contrast information from diverse perspectives, thereby providing more comprehensive and clearer image-based evidence for microscopic materials analysis.

In terms of operability, DSEM-100 features a touchscreen interface and integrates highly automated imaging functions, which transform the traditionally complex SEM workflow into an intuitive and streamlined operation. This significantly lowers the technical barrier to entry, enabling even non-expert users to rapidly obtain high-quality images.

The DSEM-100 incorporates an artificial intelligence module that automates the entire workflow: specimen observation - parameter optimization - image acquisition. As the first SEM equipped with autonomous operational capability in China , it employs intelligent recognition and automatic adjustments for self-directed imaging. This transitions SEM from “expert-dependent operation” to “intelligent autonomous imaging”, delivering greater efficiency, stability, and ease of use to users.

Yidon Technologies DSEM-100 desktop field emission scanning electron microscope employs shottkey FEG combined with compound objective lens, delivering exceptional low-voltage imaging performance with a resolution of 1.5 nm @ 5 kV and 3 nm @ 1 kV. The instrument is well-suited for high-resolution imaging of a wide range of materials, with particular applicability to challenging specimens such as non-conductive samples and those susceptible to electron-beam irradiation damage.

DSEM-100 is equipped with In-lens Secondary Electron detector and Backscattered Electron detector, enabling efficient collection of multiple electron signals generated from the specimen. This configuration allows for the acquisition of microstructural, topological, and compositional contrast information from diverse perspectives, thereby providing more comprehensive and clearer image-based evidence for microscopic materials analysis.

In terms of operability, DSEM-100 features a touchscreen interface and integrates highly automated imaging functions, which transform the traditionally complex SEM workflow into an intuitive and streamlined operation. This significantly lowers the technical barrier to entry, enabling even non-expert users to rapidly obtain high-quality images.

The DSEM-100 incorporates an artificial intelligence module that automates the entire workflow: specimen observation - parameter optimization - image acquisition. As the first SEM equipped with autonomous operational capability in China , it employs intelligent recognition and automatic adjustments for self-directed imaging. This transitions SEM from “expert-dependent operation” to “intelligent autonomous imaging”, delivering greater efficiency, stability, and ease of use to users.

Yidon Technologies DSEM-100 desktop field emission scanning electron microscope employs shottkey FEG combined with compound objective lens, delivering exceptional low-voltage imaging performance with a resolution of 1.5 nm @ 5 kV and 3 nm @ 1 kV. The instrument is well-suited for high-resolution imaging of a wide range of materials, with particular applicability to challenging specimens such as non-conductive samples and those susceptible to electron-beam irradiation damage.

DSEM-100 is equipped with In-lens Secondary Electron detector and Backscattered Electron detector, enabling efficient collection of multiple electron signals generated from the specimen. This configuration allows for the acquisition of microstructural, topological, and compositional contrast information from diverse perspectives, thereby providing more comprehensive and clearer image-based evidence for microscopic materials analysis.

In terms of operability, DSEM-100 features a touchscreen interface and integrates highly automated imaging functions, which transform the traditionally complex SEM workflow into an intuitive and streamlined operation. This significantly lowers the technical barrier to entry, enabling even non-expert users to rapidly obtain high-quality images.

The DSEM-100 incorporates an artificial intelligence module that automates the entire workflow: specimen observation - parameter optimization - image acquisition. As the first SEM equipped with autonomous operational capability in China , it employs intelligent recognition and automatic adjustments for self-directed imaging. This transitions SEM from “expert-dependent operation” to “intelligent autonomous imaging”, delivering greater efficiency, stability, and ease of use to users.