Resource Center
Desktop Field Emission Scanning Electron Microscope DSEM-100
发布时间：2026-08-11 11:17
-
File size: 2.0MB
Yidon Technologies DSEM-100 desktop field emission scanning electron microscope employs shottkey FEG combined with compound objective lens, delivering exceptional low-voltage imaging performance with a resolution of 1.5 nm @ 5 kV and 3 nm @ 1 kV. The instrument is well-suited for high-resolution imaging of a wide range of materials, with particular applicability to challenging specimens such as non-conductive samples and those susceptible to electron-beam irradiation damage.
Previous
Previous
Customer service telephone
Enterprise mailbox
Company address
Rooms 101 and 201, Building 11, No 8, Jinfeng Road, Suzhou New District, Jiangsu Province, China
Copyright©2023 Yidon Technologies Co., Ltd. All rights reserved Website Construction:China Enterprise Power Kunshan SEO