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Field Emission Scanning Electron Microscope YF-2800
发布时间：2025-02-13 13:38
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File size: 1.7MB
The YF-2800 scanning electron microscope (SEM) has excellent low-voltage and high-resolution imaging capabilities, and is equipped with a thermal field emission electron gun (Schottky FEG) to obtain high resolution while ensuring the stability of the beam current. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging perrormance at low accelerating voltages. The immersion magnetic-objective lens design furrher enhances the high-resolution imaging capability of the system. The optimized detection system can efficiently collect secondarr electron and backscattered electron signals at low voltage, which can directly observe non-conductive samples at low voltage, reduce the irradiation damage to the sample, and reveal the surfrace micromorphology and structure information.
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