Field Emission Scanning Electron Microscope YF-2800
The YF-2800 scanning electron microscope (SEM) has excellent low-voltage and high-resolution imaging capabilities, and is equipped with a thermal field emission electron gun (Schottky FEG) to obtain high resolution while ensuring the stability of the beam current. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging perrormance at low accelerating voltages. The immersion magnetic-objective lens design furrher enhances the high-resolution imaging capability of the system. The optimized detection system can efficiently collect secondarr electron and backscattered electron signals at low voltage, which can directly observe non-conductive samples at low voltage, reduce the irradiation damage to the sample, and reveal the surfrace micromorphology and structure information.
Classification:
Scanning Electron Microscope
Core advantages
Product Advantages
Excellent Expansion Ability
User Interface
- 产品描述
- 用户界面
- 性能参数
- 应用案例
-
- Commodity name: Field Emission Scanning Electron Microscope YF-2800
The YF-2800 scanning electron microscope (SEM) has excellent low-voltage and high-resolution imaging capabilities, and is equipped with a thermal field emission electron gun (Schottky FEG) to obtain high resolution while ensuring the stability of the beam current. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging perrormance at low accelerating voltages. The immersion magnetic-objective lens design furrher enhances the high-resolution imaging capability of the system. The optimized detection system can efficiently collect secondarr electron and backscattered electron signals at low voltage, which can directly observe non-conductive samples at low voltage, reduce the irradiation damage to the sample, and reveal the surfrace micromorphology and structure information.
Product Advantages
Excellent Expansion Ability
-
· Clear and concise interface layout
· Ergonomic keyboard design
· Equipped with multiple safety interlocks
· Simple and smooth operation
-
Kernel parameters Resolution 15kV 0.8nm（SE） 1kV 1.2nm（SE） Acceleration voltage 0.02~30kV Magnification 1~2000000x Gun type Schottky FEG Objective lens Electrostratic-magnetic compound immersion objective lens Probe current 1pA~20nA（100nA Optional configuration） Image size 512*512~16k*16k Detector and expansion equipment Standard configuration ET detector Inlens detector Optional configuration BSD detector Low-voltageBSD detector STEM detector Plasma cleaner Specimen chamber Chamber 340mm inner diameter, 260mm height Multiple accessory ports for EBSD, EDS, CL, etc. Sample exchange chamber is optional. Specimen stage 5-axes automatic stage X、Y=125mm，Z=50mm，R=360°cont.，T=-5~70° Image system Dual cameras (Top-view and side-view camera) Software Language Chinese/English, other languages can be customized System Windows Automatic functions Automatic focus, automatic brightness/contrast, etc. Other functions Split screen display, image annotation and measurement, image blending, large-area image acquisition and stitching, etc. -
Carbon nanotubes
Silicon-carbon anode materials
Electron beam exposure etching pattern
TiO2 nanosheets
Wet stretch film
Lithium iron phosphate positive electrode sheet
HfO2/SiC ceramic
Mouse cerebral corex tissues
Performance parameters
- 产品描述
- 用户界面
- 性能参数
- 应用案例
-
- Commodity name: Field Emission Scanning Electron Microscope YF-2800
The YF-2800 scanning electron microscope (SEM) has excellent low-voltage and high-resolution imaging capabilities, and is equipped with a thermal field emission electron gun (Schottky FEG) to obtain high resolution while ensuring the stability of the beam current. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging perrormance at low accelerating voltages. The immersion magnetic-objective lens design furrher enhances the high-resolution imaging capability of the system. The optimized detection system can efficiently collect secondarr electron and backscattered electron signals at low voltage, which can directly observe non-conductive samples at low voltage, reduce the irradiation damage to the sample, and reveal the surfrace micromorphology and structure information.
Product Advantages
Excellent Expansion Ability
-
· Clear and concise interface layout
· Ergonomic keyboard design
· Equipped with multiple safety interlocks
· Simple and smooth operation
-
Kernel parameters Resolution 15kV 0.8nm（SE） 1kV 1.2nm（SE） Acceleration voltage 0.02~30kV Magnification 1~2000000x Gun type Schottky FEG Objective lens Electrostratic-magnetic compound immersion objective lens Probe current 1pA~20nA（100nA Optional configuration） Image size 512*512~16k*16k Detector and expansion equipment Standard configuration ET detector Inlens detector Optional configuration BSD detector Low-voltageBSD detector STEM detector Plasma cleaner Specimen chamber Chamber 340mm inner diameter, 260mm height Multiple accessory ports for EBSD, EDS, CL, etc. Sample exchange chamber is optional. Specimen stage 5-axes automatic stage X、Y=125mm，Z=50mm，R=360°cont.，T=-5~70° Image system Dual cameras (Top-view and side-view camera) Software Language Chinese/English, other languages can be customized System Windows Automatic functions Automatic focus, automatic brightness/contrast, etc. Other functions Split screen display, image annotation and measurement, image blending, large-area image acquisition and stitching, etc. -
Carbon nanotubes
Silicon-carbon anode materials
Electron beam exposure etching pattern
TiO2 nanosheets
Wet stretch film
Lithium iron phosphate positive electrode sheet
HfO2/SiC ceramic
Mouse cerebral corex tissues
Application Cases
- 产品描述
- 用户界面
- 性能参数
- 应用案例
-
- Commodity name: Field Emission Scanning Electron Microscope YF-2800
The YF-2800 scanning electron microscope (SEM) has excellent low-voltage and high-resolution imaging capabilities, and is equipped with a thermal field emission electron gun (Schottky FEG) to obtain high resolution while ensuring the stability of the beam current. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging perrormance at low accelerating voltages. The immersion magnetic-objective lens design furrher enhances the high-resolution imaging capability of the system. The optimized detection system can efficiently collect secondarr electron and backscattered electron signals at low voltage, which can directly observe non-conductive samples at low voltage, reduce the irradiation damage to the sample, and reveal the surfrace micromorphology and structure information.
Product Advantages
Excellent Expansion Ability
-
· Clear and concise interface layout
· Ergonomic keyboard design
· Equipped with multiple safety interlocks
· Simple and smooth operation
-
Kernel parameters Resolution 15kV 0.8nm（SE） 1kV 1.2nm（SE） Acceleration voltage 0.02~30kV Magnification 1~2000000x Gun type Schottky FEG Objective lens Electrostratic-magnetic compound immersion objective lens Probe current 1pA~20nA（100nA Optional configuration） Image size 512*512~16k*16k Detector and expansion equipment Standard configuration ET detector Inlens detector Optional configuration BSD detector Low-voltageBSD detector STEM detector Plasma cleaner Specimen chamber Chamber 340mm inner diameter, 260mm height Multiple accessory ports for EBSD, EDS, CL, etc. Sample exchange chamber is optional. Specimen stage 5-axes automatic stage X、Y=125mm，Z=50mm，R=360°cont.，T=-5~70° Image system Dual cameras (Top-view and side-view camera) Software Language Chinese/English, other languages can be customized System Windows Automatic functions Automatic focus, automatic brightness/contrast, etc. Other functions Split screen display, image annotation and measurement, image blending, large-area image acquisition and stitching, etc. -
Carbon nanotubes
Silicon-carbon anode materials
Electron beam exposure etching pattern
TiO2 nanosheets
Wet stretch film
Lithium iron phosphate positive electrode sheet
HfO2/SiC ceramic
Mouse cerebral corex tissues
Customer service telephone
Enterprise mailbox
Company address
88, Keling Road, Suzhou New District, Jiangsu Province, 215163, China
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