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Yidon Technologies Releases Its First High-Resolution Scanning Electron Microscope
12-05
In the golden autumn of October, symbolizing a season of abundant harvest and hope, Yidong Technologies (Suzhou) Co., Ltd. ("Yidon Technologies") celebrated its own "harvest" moment. On October 25th, Yidon Technologies held an online product launch event themed "New Beginnings with Yidong, Shining into the Future," which attracted hundreds of attendees from research institutes and industrial enterprises for learning and interaction.
Aiming to address national strategic needs and technological bottlenecks, the launch introduced Yidon Technologies' first field emission scanning microscope YF-1801, along with auxiliary devices like the plasma cleaner YP-20 for cleaning hydrocarbon contaminants on electron microscope samples and chamber surfaces, the PHP-4 tape hydrophilization treatment instrument for enhancing the hydrophilicity of tape surfaces used in biological sampling, the MC-4 multifunctional sample cleaner integrating plasma cleaning, ultraviolet irradiation, and vacuum heating desorption, and the Dalex-100 micro-gas injection system for ion beam and electron beam induced deposition and etching.
Scanning electron microscopes (SEM) are sophisticated electron-optical instruments widely used in various research fields and industrial sectors like materials, biology, medicine, metallurgy, chemistry, and semiconductors, and are often referred to as "microscopic cameras." For a long time, this market has been dominated by foreign giants, heavily relying on imports. However, with the acceleration of independent innovation by domestic electron microscope manufacturers, this situation is gradually changing.
The YF-1801 SEM uses a Schottky FEG (field emission gun) technology and incorporates advanced full-column acceleration technology in its electron optical column, ensuring superior imaging performance at low acceleration voltages. Traditional SEMs require conductive coatings on non-conductive samples for observation. In contrast, modern SEMs observe non-conductive samples directly by lowering the acceleration voltage of incident electrons.
With a resolution of 1nm at 15kV and 1.5nm at 1kV, YF-1801 is a high-resolution, low-voltage SEM suitable for high-resolution imaging of various non-conductive and electron-sensitive samples. It signifies that Yidon Technologies has reached the technical level of mainstream foreign microscope manufacturers in terms of scanning microscope electron optics design and signal detection.
Furthermore, Yidon Technologies, in collaboration with a renowned domestic design company, has launched user-friendly software and a mainframe design that aligns with mainstream aesthetics to create tools and products accessible and easy for everyone. Whether it's the user interface or the mainframe, Yidon's goal is to provide a user experience that is clear in functionality, simple in operation, and instantly likable.
With a promising market for domestic scanning electron microscopes, Yidon Technologies remains committed to innovation-driven development, striving to achieve customer satisfaction and continually offering products with superior performance and convenience, delivering impressive results to the market.
Dec 30,2024
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